Simulation of secondary particles and measurement of the proton spectrum on BEPCII-LINAC test beam

YANG Tao1; 2 LI Jiacai2 TANG Xinghua2; 3 GU Yunting1 KE Zunjian2 AN Guangpeng2 ZHANG Shaoping2 1

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Simulation of secondary particles and measurement of the proton spectrum on BEPCII-LINAC test beam

更新时间：2021-03-05

- Simulation of secondary particles and measurement of the proton spectrum on BEPCII-LINAC test beam
- NUCLEAR TECHNIQUES Vol. 34, Issue 4, (2011)
- 作者机构：
  
  1. 广西大学物理科学与工程技术学院
  2. 中国科学院高能物理研究所
  3. 兰州大学核科学与技术学院
- 作者简介：
- 基金信息：
  
  中国科学院重大科研装备研制项目(29200731231123310)资助
- DOI：
  CLC： O572.21
- Published：01 April 2011
- 稿件说明：
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[1]杨涛,李家才,唐兴华,顾运厅,柯尊建,安广朋,张少平.BEPCII-LINAC试验束次级粒子的模拟分析及质子能谱测量[J].核技术,2011,34(04):261-266.

YANG Tao1, 2 LI Jiacai2 TANG Xinghua2, 3 GU Yunting1 KE Zunjian2 AN Guangpeng2 ZHANG Shaoping2 1. Simulation of secondary particles and measurement of the proton spectrum on BEPCII-LINAC test beam[J]. Nuclear techniques, 2011, 34(4): 261-266.
[1]杨涛,李家才,唐兴华,顾运厅,柯尊建,安广朋,张少平.BEPCII-LINAC试验束次级粒子的模拟分析及质子能谱测量[J].核技术,2011,34(04):261-266. DOI：

YANG Tao1, 2 LI Jiacai2 TANG Xinghua2, 3 GU Yunting1 KE Zunjian2 AN Guangpeng2 ZHANG Shaoping2 1. Simulation of secondary particles and measurement of the proton spectrum on BEPCII-LINAC test beam[J]. Nuclear techniques, 2011, 34(4): 261-266. DOI：

摘要

对BEPCII-LINAC试验束上1.89 GeV脉冲电子轰击铍靶产生的次级粒子进行蒙特卡罗模拟

得到次级粒子的能谱和角度分布谱。Geant4模拟显示混合粒子中质子能量大于35 MeV的通量较大

且质子产额达到3.97×108 s-1

同时质子对器件的注量率?p可达6.32×105 s-1.cm-2。用试验束41°磁谱仪和E3线上的探测系统测量得到的质子能谱验证了次级粒子注量率和产额的模拟结果。模拟和实验结果都显示BEPCII-LINAC试验束次级束中的质子满足半导体器件单粒子效应实验要求。

Abstract

Bombarding a beryllium target with 1.89 GeV pulsed electron beams produces a large number of secondary particles(protons

neutrons

gamma phones

pions

positrons and electrons).The energy spectrum and angular distribution of the secondary particles are simulated with the Geant4 code.The results indicate that the protons of over 35 MeV have a yield of 3.97×108 s-1 and flux of 6.32×105 s-1.cm-2.Measurement at fixed-angle of 41° magnetic spectrometer of the BEPCII-LINAC Test-Beam is consistent with the simulation results.Protons of secondary beam at BEPCII-LINAC Test-Beam can be used in Single Event Effects(SEE) research of the semiconductor devices.

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