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Calibration of a PIXE-RBS ion beam analysis system
- NUCLEAR TECHNIQUES Vol. 40, Issue 8, Article number: 080201(2017)
- 作者机构：
四川大学原子核科学技术研究所 辐射物理及技术教育部重点实验室 成都 610064
- 作者简介：
- 基金信息：National Natural Science Foundation of China;Key Laboratory of Neutron Physics, China Academy of Engineering Physics
DOI：10.11889/j.0253-3219.2017.hjs.40.080201
CLC： TL81Received：15 January 2017，
Revised：22 March 2017，
Published：10 August 2017
- 稿件说明：
移动端阅览
Chuandong XIA, Mantian LIU, Jingjun ZHU, et al. Calibration of a PIXE-RBS ion beam analysis system[J]. Nuclear techniques, 2017, 40(8): 080201
Chuandong XIA, Mantian LIU, Jingjun ZHU, et al. Calibration of a PIXE-RBS ion beam analysis system[J]. Nuclear techniques, 2017, 40(8): 080201 DOI： 10.11889/j.0253-3219.2017.hjs.40.080201.
摘要
四川大学原子核科学技术研究所依托2.5MeV范德格拉夫静电加速器搭建了质子诱发X射线荧光分析（Proton Induced X-ray Emission，PIXE）与卢瑟福背散射分析（Rutherford Backscattering Spectrometry，RBS）相结合的离子束分析系统，描述了该分析系统和刻度过程。通过10个金属单质的PIXE-RBS测量，刻度得到的仪器常数
H
值是一条随能量变化的曲线，然后采用最小二乘法拟合确定了X射线探测器前的Mylar膜有效厚度、选择性滤膜的有效厚度和中心小孔大小，从而得到
H
值。为了对刻度
H
值进行检验，在相同实验条件下测量了标准粘土样品元素成分，测量数据与证书数据符合得较好。刻度结果将用于以后的PIXE-RBS分析。
Abstract
Background
2
An ion beam analysis system combining proton induced X-ray emission (PIXE) and Rutherford backscattering spectrometry (RBS) has been established based on the 2.5-MeV Van de Graaff accelerator facility in Institute of Nuclear Science and Technology
Sichuan University.
Purpose
2
Calibration of this PIXE-RBS system must be done before further quantitative analysis. The aim is to calibrate this PIXE-RBS system for future quantitative analysis.
Methods
2
10 single-element thick pure metal samples were measured by PIXE-RBS under experimental condition to determine the so-called instrumental constant
H
. The least square fit method was utilized to determine the effective thickness of Mylar and Al absorbers and aperture diameter of the funny filter in front of the X-ray detector.
Results
2
The measured
H
values calculated from experimental spectra for K-shell X-rays of ten single-element thick pure metal samples were a function of X-ray energy
and the
H
values recalculated using aforementioned three effective values became a constant. A clay standard sample was measured at the same experimental condition to test the accuracy of the calibration
and the measured elemental content values and certified values are in good agreement.
Conclusion
2
The accuracy of the calibration was satisfactory and the calibration results will be used for future PIXE-RBS analysis.
关键词
Keywords
references
S A E Johansson , J L Campbell , K G Malmqvist . Particle-induced X-ray emission spectrometry (PIXE) , : New York Wiley Press , 1995 .
W K Chu , J W Mayer , M A Nicolet . Backscattering spectrometry , : New York Academic Press , 1978 .
杨 福家 , 赵 国庆 . 离子束分析 , : 上海 复旦大学出版社 , 1985 .
Fujia YANG , Guoqing ZHAO . Ion beam analysis , : Shanghai Fudan University Press , 1985 .
赵 国庆 , 任 炽刚 . 核分析技术 , : 北京 原子能出版社 , 1989 .
Guoqing ZHAO , Chigang REN . Nuclear analysis technology , : Beijing Atomic Energy Press , 1989 .
L Ye , M T Liu , W Huang , . PIXE/RBS studies on ancient pottery from Jinsha ruins site of Chengdu . Nuclear Physics Review , 2010 . 27 ( 4 ): 493 - 499 . http://en.cnki.com.cn/article_en/cjfdtotal-hwdt201004021.htm .
Q Q Wu , J J Zhu , M T Liu , . PIXE-RBS analysis on potteries unearthed from Lijiaba site . Nuclear Instruments and Methods in Physics Research B , 2013 . 296 1 - 6 . DOI: 10.1016/j.nimb.2012.12.004 http://doi.org/10.1016/j.nimb.2012.12.004 .
Z Zhou , K Zhang , C D Xia , . Analysis of elemental composition of porcelains unearthed from Waguantan kiln site by PIXE-RBS . Nuclear Instruments and Methods in Physics Research Section B:Beam Interactions with Materials and Atoms , 2015 . 346 1 - 7 . DOI: 10.1016/j.nimb.2015.01.031 http://doi.org/10.1016/j.nimb.2015.01.031 .
J F Dias , A Bulla , M L Yoneama . Charging effects in thick insulating samples . Nuclear Instruments and Methods in Physics Research Section B:Beam Interactions with Materials and Atoms , 2002 . 189 ( 1-4 ): 72 - 76 . DOI: 10.1016/S0168-583X(01)00997-1 http://doi.org/10.1016/S0168-583X(01)00997-1 .
I M Ismail , M S Rihawy . Comprehensive method to analyze thick insulating samples using PIXE technique . Nuclear Instruments and Methods in Physics Research Section B:Beam Interactions with Materials and Atoms , 2013 . 296 50 - 53 . DOI: 10.1016/j.nimb.2012.11.016 http://doi.org/10.1016/j.nimb.2012.11.016 .
Z Nejedly , J L Campbell , S Gama . An Excel utility for the rapid characterization of "funny filters" in PIXE analysis . Nuclear Instruments and Methods in Physics Research B , 2004 . 219-220 136 - 139 . DOI: 10.1016/j.nimb.2004.01.041 http://doi.org/10.1016/j.nimb.2004.01.041 .
S Gama , M Volfinger , C Ramboz , . Accuracy of PIXE analyses using a funny filter . Nuclear Instruments and Methods in Physics Research B , 2001 . 181 150 - 156 . DOI: 10.1016/S0168-583X(01)00350-0 http://doi.org/10.1016/S0168-583X(01)00350-0 .
A Shariff , K Bülow , M Elfman , . Calibration of a new chamber using GUPIX software package for PIXE analysis . Nuclear Instruments and Methods in Physics Research B , 2002 . 189 131 - 137 . DOI: 10.1016/S0168-583X(01)01018-7 http://doi.org/10.1016/S0168-583X(01)01018-7 .
J L Campbell , T L Hopman , J A Maxwell , . The Guelph PIXE software package Ⅲ:alternative proton database . Nuclear Instruments and Methods in Physics Research B , 2000 . 170 193 - 204 . DOI: 10.1016/S0168-583X(00)00156-7 http://doi.org/10.1016/S0168-583X(00)00156-7 .
M Mayer . SIMNRA user's guide , : Report IPP 9/133, Garching, Germany Max-Planck-Institut für Plasmaphysik , 1997 .
J L Campbell , N I Boyd , N Grassi , . The Guelph PIXE software package Ⅳ . Nuclear Instruments and Methods in Physics Research B , 2010 . 268 ( 20 ): 3356 - 3363 . DOI: 10.1016/j.nimb.2010.07.012 http://doi.org/10.1016/j.nimb.2010.07.012 .
J L Zhao , L X Tian , X L Li , . Measurements of L shell X-ray yields of thick Ag target by 6-29 keV electron impact . Radiation Physics and Chemistry , 2015 . 107 47 - 53 . DOI: 10.1016/j.radphyschem.2014.09.009 http://doi.org/10.1016/j.radphyschem.2014.09.009 .
谭 文静 , 安 竹 , 朱 敬军 , . 10-25 keV电子致厚W, Au靶轫致辐射谱的测量 . 物理学报 , 2016 . 65 87 - 93 . DOI: 10.7498/aps.65.113401 http://doi.org/10.7498/aps.65.113401 .
Wenjing TAN , Zhu AN , Jingjun ZHU , . Bremsstrahlung spectra produced by 10-25 keV electron impact on thick W, Au targets . Acta Physica Sinica , 2016 . 65 87 - 93 . DOI: 10.7498/aps.65.113401 http://doi.org/10.7498/aps.65.113401 .
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