您当前的位置:
首页 >
文章列表页 >
Design and test of time-interpolation TDC based on 0.13μm CMOS process
NUCLEAR ELECTRONICS AND INSTRUMENTATION | 更新时间:2021-05-19
    • Design and test of time-interpolation TDC based on 0.13μm CMOS process

    • NUCLEAR TECHNIQUES   Vol. 41, Issue 4, Article number: 040401(2018)
    • DOI:10.11889/j.0253-3219.2018.hjs.41.040401    

      CLC: TL824
    • Received:16 June 2017

      Revised:20 October 2017

      Published:10 April 2018

    移动端阅览

  • Da GE, Futian LIANG, Xinzhe WANG, et al. Design and test of time-interpolation TDC based on 0.13μm CMOS process[J]. Nuclear techniques, 2018, 41(4): 040401 DOI: 10.11889/j.0253-3219.2018.hjs.41.040401.

  •  
  •  

0

Views

25

下载量

2

CSCD

Alert me when the article has been cited
提交
Tools
Download
Export Citation
Share
Add to favorites
Add to my album

Related Articles

Design and implementation of testing system of the readout ASIC-MaPMT_v10 for scintillator neutron detector

Related Author

PU Yanan
ZENG Yun
ZHAO Yubin
LI Huaishen
WU Wenhuan
CHEN Shaojia

Related Institution

School of Physics and Electronics, Hunan University
Dongguan Institute of Neutron Science
Institute of High Energy Physics, Chinese Academy of Sciences
0