YAO Zhibin HE Baoping ZHANG Fengqi GUO Hongxia LUO Yinhong WANG Yuanming ZHANG Keying. An experimental study on total dose effects in SRAM-based FPGAs[J]. Nuclear techniques, 2009, 32(12): 935-939.
YAO Zhibin HE Baoping ZHANG Fengqi GUO Hongxia LUO Yinhong WANG Yuanming ZHANG Keying. An experimental study on total dose effects in SRAM-based FPGAs[J]. Nuclear techniques, 2009, 32(12): 935-939.DOI:
In order to study testing methods and find sensitive parameters in total dose effects on SRAM-based FPGA
XC2S100 chips were irradiated by 60Co γ-rays and tested with two test circuit designs.By analyzing the experimental results
the test flow of configuration RAM and bock RAM was given
and the most sensitive parameter was obtained.The results will be a solid foundation for establishing test specification and evaluation methods of total dose effects on SRAM-based FPGAs.