SEE have became a substantial Achilles heel for the reliability of space-based advanced CMOS technologies with features size downscaling.Future space and defense systems require identification and understanding of single event effects to develop hardening approaches for advanced technologies

including changes in device geometry and materials affect energy deposition

charge collection

circuit upset

parametric degradation devices.Topics covered include the impact of technology scaling on radiation response

including single event transients in high speed digital circuits

evidence for single event effects caused by proton direct ionization

and the impact for SEU induced by particle energy effects and indirect ionization.The single event effects in CMOS replacement technologies are introduced briefly.